The HD-2700 is the top-of-the-range STEM, featuring optional spherical aberration correction (developed in collaboration with CEOS GmbH) to offer significantly improved resolution and analytical sensitivity. By correcting the spherical aberration, a 10 times higher probe current can be achieved, together with an atomic lattice resolution of 80pm in dark-field STEM mode. The HD-2700 has applications in materials science, semiconductors and nanotechnology, both in research and development and quality control.
The Cs corrector is field retrofittable to HD-2700 systems originally ordered without the corretion unit.
For the electron source, the user has a choice between a Schottky Emission and a Cold Field Emission unit. This cold field emission source, Hitachi's unique proprietary technology, provides a very narrow energy spread combined with high point source brightness, optimum for EELS work, and makes difficult-to-use and current-limiting monochromators obsolete.
High speed, high sensitivity EDX analysis is possible. The high probe current of the HD-2700, together with the design-inherent large detector solid angle, allows for extremely rapid acquisition of elemental distribution images, even for elements at low concentration. .
Electron energy loss spectrometry (EELS) is also available for analysis with enhanced spatial resolution down to the atomic level. Especially the Cold Field Emission electron source with its energy spread of 0.2-0.4eV (FWHM) or less - compared to 0.7-0.8eV of a Schottky emitter - offers the possibility to investigate subtle differences in chemical bonding states without the need of a current limiting monchromator.
Extremely versatile imaging allows simultaneous multiple-image acquisition and display, with a wide variety of combinations. So is the HD-2700 equipped with a SE detector, greatly supporting sample navigation and characterization. Furthermore, the unique STEM design allows to observe simultanously live diffraction and ADF-STEM signals. Other detector combinations include SE/BF, SE/DF, BF/DF, DF/EDX and DF/EELS.
The HD-2700 enjoys the same SEM-like simplicity of operation as other models in the HD-series and also has sample holders that are fully compatible with Hitachi's Focused Ion Beam Systems, ensuring seamless interchange between the instruments without need to manipulate with tiny sample grids.