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European Sales Representatives

Products & Services

Electron Microscopes

• TableTop Microscopes
• Allround SEM (VP- SEM)
  • SU1510 Compact VP-SEM
  • S-3400N VP-SEM
  • S-3700N Large Chamber VP-SEM
• Field Emission SEMs
  • SU6600
  • SU-70
  • S-4800
  • SU8000
  • S-5500
• TEM & Dedicated STEM
  • H-7650
  • HD-2700
  • HF-3300
• Focused Ion Beam Systems (FIB)
  • FB-2200 FIB
  • NB5000 FIB-SEM
• Sample Preparation Equipment
  • E-3500
  • IM-3000
• Used instruments
  • S-510
  • S-570
  • H-600
  • H-800
  • S-800
  • S-806
  • S-2300
  • S-6280H
• Services
  • Services
  • Solution business
  • Service contracts
• Hitachi Microscope News
  • Hitachi E.M. News Vol. 3

Semiconductor Equipment

• Metrology & Process Control
  • CD-SEM
• Defect Inspection & Review
  • Unpatterned Wafer Inspection
  • Darkfield Optics Wafer Inspection
  • Defect Review & Classification
• Failure Analysis & Electron Microscopes
  • N-6000
• Plasma Etching & Gas Abatement

Industrial Instruments & Machinery

• Products
  • GXH-3
  • GXH-3J
  • GXH-1S
  • GXH-1JS
  • PXH-1
  • TCM-X Series
  • Further SMT equipment
• Service
  • Spare Parts
  • Training

Scientific Instruments

Electronic Components

Electronic Materials

Contacts

Electron Microscopes & Semiconductor Equipment

• Service Department

Industrial Instruments & Machinery

Scientific Instruments

Electronic Components & Devices

Electronic Material

Career

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Corporate information

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