The imaging power and reliability of our field emission microscopes are legend. Over 4.600 sold field emission scanning electron microscopes world-wide over the past 35 years manifest the deep satisfaction of our users with our technology and service.
Today, Hitachi offers a range of state-of-the-art field emission SEMs, covering all applications from ultimate high-resolution imaging to powerful analytical work.
SEMs with Schottky Emission Source:
Variable Chamber Pressure + Field-free Optics
SU6600 Analytical Variable Pressure SEM
Imaging & Analysis: Semi-In-Lens/Field-free Dual Optics
SU-70 Ultra-High-Resolution & Analytical SEM
SEMs with Cold Field Emission Source:
SU8000family with Semi-Inlens optics
Entry Level, Dual Detection
SU8010 Ultra-High-Resolution SEM - NEW -
Magic-Eye Triple Detection
SU8020 Ultra-High-Resolution SEM- NEW -
Magic-Eye Triple Detection, large specimen chamber
SU8030 Ultra-High-Resolution SEM- NEW -
Triple Detection + REGULUS high-performance stage
SU8040 Ultra-High-Resolution SEM
Original Inlens Optics
SU9000 next-generation Ultra-High-Resolution SEM/Duo-STEM