Nature has a tendency not to present the most decisive details for your research freely on the surface of your microscopy sample. For this reason, we have developed a special high-performance system combination which allows quick and reliable access to even hidden features and provides views into the 3rd dimension.
With our Focused Ion Beam System and Scanning Transmission Electron Microscope combination, researchers now have an instrument system of outstanding high performance. One prominent feature is the precise, quick and reliable preparation of high-quality
(S)TEM specimens by means of Hitachi's patented micro-sampling technology:
The freshly milled TEM lamella can be sampled directly in the chamber of the FIB by means of an integrated nano manipulator, applied directly to the STEM specimen holder and secured reliably by means of a special patented process. STEM can be used for the entire range of analysis methods - right up to atomic resolution.
