Hitachi VP-SEM S-3700N

The Hitachi S-3700N will complete our Tungsten-SEM-Portfolio with it´s large chamber capabilities and the known S-3400N features.

Many advantages from Hitachi´s Bestseller S-3400N and the versatility of the precessor model S-3600N have been unified in our NEW ANALYTICAL VP-SEM S-3700N.

Inspire the next with Hitachi!

Get convinced!
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- Large Samples upt o 300mm in diameter
- Observable area up to 203mm in diameter
- Observation and EDX analysis on asample up to 110mm tall

- EDX, EBSD and WDX simultaneously avalaible
- Versatile port layout for various analytical applications
- 5-axis computer motorized stage with -20° - +90° tilt
- One-Button selctable High Vacuum (HV) / Low Vacuum (LV) Modes
- Ecological design by clean Turbo Molecular Pumping
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Secondary electron image resolution	3.0 nm   GUARANTEED  (30 kV - HV mode)
	10.0 nm GUARANTEED  (30 kV - HV mode)
BackScattered electron image resolution	4.0 nm   GUARANTEED  (30 kV - LV mode)
Electron optics	Hitachi patented Quad Bias-function instead of expensive LaB6-tips	STANDARD
Electron gun	Tungsten Emitter (Filament-change within 20 minutes)
Accelerating Voltage	0.3 - 30 kV
Magnification	5X - 300.000X
	RELATED to POLAROID (4" X 5")
Objective aperture	5-Positions, ClickStop Objective Aperture
Detector system	Everhardt Thornley Secondary Electrons (SE) Detector	STANDARD
	High Sensitivity Semiconductor BSE Detector - 4+1-Segment	STANDARD
	EnergyDispersiveX-ray Spectrometer (EDX)	OPTION
	FF WavelengthDispersiveX-ray Spectrometer (WDX)	OPTION
	ElectronBackScatteredDiffraction-Analyzer (EBSD)	OPTION
	Cathode Luminescence Spectrometer (CL)	OPTION
	Environmental SE Detector ESED II (2.GENERATION!!!)	OPTION
	X-ray source	OPTION
Low Vacuum Range	6 - 270 Pa
Image Shift	± 50µm at WD = 10mm
Specimen stage	X = 0 - 150 mm
	Y = 0 - 110 mm
	Z = 5.0 - 65 mm
	R = 360°
	T = -20° - +90°
	Maximum Height = 110mm
	Observable area in diameter = 203 mm with Rotation
	Maximum specimen size in diameter = 300 mm
Image display	PC with Operating system Windows XP	STANDARD
	One or two 19" LCD-FLAT-PANEL	STANDARD
	640 x 480 up to 5.120 x 3.840 pixel	STANDARD
	Multiple Image formats (JPG/TIFF/BMP)	STANDARD
	Signal Mixing - Fully selectable Detector signals	STANDARD
	Dual Image Display	STANDARD
Automatic Alignment	Auto Beam Setting - Auto Axial Alignment	STANDARD
Auto Image Adjustments	Auto Focus - Auto Stigmator/Focus	STANDARD
	Auto Brightness & Contrast	STANDARD
Additionals	Oil-free evacuation system	STANDARD
	Specimen exchange with 30 SECONDS	STANDARD
	Easy-to-use software (proven S-3400N GUI)	STANDARD
	Hitachi SEM Security System	STANDARD
	Hitachi Control panel with proven Rotary Knob Set	STANDARD
	Dynamic Focus & Tilt compensation	STANDARD
	Hi Mouse - One Keyboard & One Mouse for two PC´s	STANDARD
	Several Wafer holders are included	STANDARD

Download:

Hitachi Brochure S-3700N  (PDF 321 KB)
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To contact to Hitachi about this or other electron microscopes,

• call        +49 (0)2151 64 35 300
• fax          +49 (0)2151 64 35 699
• email:    eminfo@hht-eu.com
• mail:      Hitachi High-Technologies Europe GmbH
                Nanotechnology Equipment Dept.
                Europark Fichtenhain A12
                47807 Krefeld
                Germany