Ultra-High-Resolution Analytical FE-SEM SU-70

We are proud to present our NEW versatile solution for analytical purposes in combination with Ultra-High-Resolution and ample Signal Selection capabilities .

The SU-70 combines two electron-optical modes in one instrument: Hitachi's famous semi-inlens optics with ExB signal filtering & detection, and a field-free mode with no magnetic field between sample and objective lens. In both modes the system delivers breath-taking probe currents up to 200nA and an impressing Low kV-resolution for upcoming conceptual formulations.

Get convinced by this performance regarding to our Hitachi "semi-in-lens"-concept and the Field-Emission-Schottky-Gun. Take advantage of this uncompromising Scanning Electron Microscope (SEM).

The SU-70 invites you to do the next steps in the nanoworld!
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• Schottky Field Emission Source
• UHR Ultra-High-Resolution 1.0 nm / 15 kV (1.6 nm / 1 kV)
• Hitachi´s unrivaled Super ExB Filter - Sophisticated SE/BSE-signal-detection
• FieldFreeMode (FF mode) - observing magnetic samples and distortion-free EBSD-analysis
• Breath-taking probe current up to 200 nA
• Versatile analytic-chamber for multiple, simultaneous analysis
• Highest Beam Stability
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Information "SU-70"-Brochure Download (PDF, 342 KB)

To contact to Hitachi about this or other electron microscopes,

• call +49 (0)2151 64 35 300
• fax  +49 (0)2151 64 35 699
• email:  eminfo@hht-eu.com
• mail:     Hitachi High-Technologies Europe GmbH
                Nanotechnology Equipment Dept.
                Europark Fichtenhain A12
                47807 Krefeld
                Germany